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Semiconductor memories : technology,...
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Sharma, Ashok K.
Semiconductor memories : technology, testing, and reliability
紀錄類型:
書目-語言資料,印刷品 : 單行本
副題名:
technology, testing, and reliability
作者:
SharmaAshok K.,
出版地:
Piscataway, N.J.
出版者:
IEEE Press;
出版年:
c1997
面頁冊數:
xii, 462 p.ill. : 26 cm.;
標題:
Semiconductor storage devices -
附註:
"IEEE order number: PC3491."
ISBN:
0-7803-1114-0
Semiconductor memories : technology, testing, and reliability
Sharma, Ashok K.
Semiconductor memories
= : technology, testing, and reliability / Ashok K. Sharma ; - Piscataway, N.J. : IEEE Press, c1997. - xii, 462 p. ; ill. ; 26 cm..
"IEEE order number: PC3491.""IEEE Solid-State Circuits Council, sponsor.".
Includes bibliographical references and index.
ISBN 0-7803-1114-0
Semiconductor storage devices
Semiconductor memories : technology, testing, and reliability
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