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Essentials of electronic testing for...

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Agrawal, Vishwani D.

Essentials of electronic testing for digital, memory, andm

紀錄類型:	書目-語言資料,印刷品 : 單行本
作者:	Bushnell, Michael L.
合作者:	Agrawal, Vishwani D.
出版地:	Boston
出版者:	Kluwer Academic Publishers;
出版年:	c.2000
面頁冊數:	xviii,690p.ill. : 25cm.;
集叢名:	Frontiers in electronic testin
標題:	Integrated circuits - Very large scale intergration -
標題:	Digital integrated circuits - Testing. -
標題:	Mixed signal circuits - Testing． -
標題:	Semiconductor storage devices - Testing. -
ISBN:	0-7923-7991-8

Essentials of electronic testing for digital, memory, andm
Bushnell, Michael L.

Essentials of electronic testing for digital, memory, andm = : / Michael L. Bushnell,Vishwani D.Agrawal ; - Boston : Kluwer Academic Publishers, c.2000. - xviii,690p. ; ill. ; 25cm.. - (Frontiers in electronic testin ; ).
Includes bibliographical references and index..
ISBN 0-7923-7991-8
Integrated circuitsDigital integrated circuitsMixed signal circuitsSemiconductor storage devices -- Very large scale intergration -- Testing. -- Testing． -- Testing.

Agrawal, Vishwani D.

Essentials of electronic testing for digital, memory, andm
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210 $a Boston $c Kluwer Academic Publishers $d c.2000
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225 2 $a Frontiers in electronic testin $v
320 $a Includes bibliographical references and index.
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606 $a Digital integrated circuits $x Testing. $2 lc $3 38716
606 $a Mixed signal circuits $x Testing． $2 lc $3 38717
606 $a Semiconductor storage devices $x Testing. $2 lc $3 38718
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701 1 $a Agrawal, Vishwani D. $3 38714
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